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Experimental results of the simultaneous measurement of spatially varying phase and polarization. |
S. Rothau, C. Kellermann, N. Lindlein
Institut für Optik, Information und Photonik der Friedrich-Alexander-Universität Erlangen-Nürnberg
sergej.rothau@fau.de |
Elements with nanostructured layers, made of metal or semiconductor, can be used for the generation of almost any polarization states. For dielectric materials the manipulation of the polarization is realized by the artificial birefringence of the structured layer, where the value of birefringence is dependent on the geometry and orientation of the nanostructures and the used material.
The characterization of such elements should take place with respect to the description of the effect on the polarization distribution and the phase front of the incident light. Optimally, the measurement of the polarization and the phase should be carried out simultaneously in a single measuring process.
Such a novel interferometric measurement method for the simultaneous measurement of any locally varying polarization and phase distribution was developed by combining phase and polarization shifting of the reference beam. The investigated methods are presented by showing experimental results and descriping the related elements. |
Keywords:
Optische Materialien, Interferometrie, Messtechnik |
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